#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203347
Mfr serial number	STN11426-03347

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203347

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12268
I_LEAK350V (microA)	0.2235
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.62
20	57.55
30	66.13
40	72.72
50	78.34
60	83.52
70	88.66
80	93.59
90	98.25
100	102.68
110	106.92
120	111.07
130	115
140	118.84
150	122.68
160	126.38
170	130
180	133.43
190	137.12
200	140.56
210	143.98
220	147.27
230	150.55
240	153.75
250	156.98
260	160.14
270	163.44
280	166.95
290	170.64
300	174.84
310	179.48
320	184.7
330	191.5
340	203
350	223.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2683.4
30	2310.25
35	2050.49
40	1854.3
45	1704.24
50	1588.64
55	1505.6
60	1456.67
65	1432.76
70	1422.59
75	1417.88
80	1415.24
85	1413.4
90	1412.03
95	1410.9
100	1409.85
105	1409.04
110	1408.41
115	1407.8
120	1407.11

#End of manufacturer data file