#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203348
Mfr serial number	STN11426-03348

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203348

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.15193
I_LEAK350V (microA)	0.2892
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.96
20	58.07
30	66.83
40	73.59
50	79.48
60	85.78
70	93.02
80	100.5
90	108.01
100	115.34
110	122.86
120	130.32
130	137.5
140	144.65
150	151.93
160	159
170	166.03
180	173.19
190	180.13
200	187
210	194
220	200.8
230	207.5
240	214.3
250	221.2
260	227.9
270	234.7
280	241.6
290	248.4
300	255.2
310	262
320	268.8
330	275.5
340	282.4
350	289.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2675.09
30	2303.94
35	2045.64
40	1850.19
45	1701.09
50	1586.95
55	1506.88
60	1461.51
65	1439.86
70	1430.55
75	1426.32
80	1423.8
85	1421.98
90	1420.63
95	1419.53
100	1418.56
105	1417.63
110	1416.91
115	1416.37
120	1415.64

#End of manufacturer data file