#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203353
Mfr serial number	STN11426-03353

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203353

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13372
I_LEAK350V (microA)	0.2062
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.03
20	62.18
30	71.26
40	78.19
50	84.28
60	90
70	95.79
80	101.28
90	106.5
100	111.46
110	116.08
120	120.77
130	125.2
140	129.51
150	133.72
160	137.85
170	141.91
180	145.87
190	149.78
200	153.65
210	157.43
220	161.16
230	164.82
240	168.42
250	171.99
260	175.45
270	178.91
280	182.3
290	185.6
300	188.7
310	192
320	195.6
330	199.1
340	202.6
350	206.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2601.03
30	2239.97
35	1988.19
40	1798.47
45	1654.34
50	1548.27
55	1479.87
60	1444.09
65	1427.83
70	1420.71
75	1417.16
80	1414.88
85	1413.24
90	1411.98
95	1410.91
100	1410.05
105	1409.28
110	1408.61
115	1408.15
120	1407.5

#End of manufacturer data file