#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203355
Mfr serial number	STN11426-03355

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203355

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12293
I_LEAK350V (microA)	0.1857
Substr Origin	101
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	194																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.34
20	57.01
30	65.5
40	71.99
50	77.6
60	82.8
70	88.13
80	93.33
90	98.19
100	102.76
110	106.97
120	111.29
130	115.25
140	119.1
150	122.93
160	126.61
170	130.2
180	133.79
190	137.23
200	140.62
210	144
220	147.28
230	150.5
240	153.66
250	156.86
260	159.93
270	162.97
280	166
290	168.93
300	171.82
310	174.7
320	177.5
330	180.27
340	183.1
350	185.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2657.7
30	2289.76
35	2033.64
40	1839.82
45	1692.12
50	1579.5
55	1501.29
60	1457.44
65	1436.62
70	1427.61
75	1423.36
80	1420.81
85	1419.04
90	1417.6
95	1416.49
100	1415.49
105	1414.6
110	1414.08
115	1413.28
120	1412.71

#End of manufacturer data file