#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203400
Mfr serial number	STN11530-03400

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203400

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1308
I_LEAK350V (microA)	0.2015
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.69
R Bias Lower (MOhm)	1.52

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.09
20	60.69
30	70.11
40	77.1
50	82.76
60	88.21
70	93.79
80	99.19
90	104.28
100	109.1
110	113.71
120	118.18
130	122.38
140	126.7
150	130.8
160	134.84
170	138.82
180	142.72
190	146.63
200	150.68
210	154.66
220	158.42
230	162.27
240	165.66
250	169.13
260	172.53
270	175.91
280	179.17
290	182.3
300	185.5
310	188.8
320	191.9
330	195.2
340	198.3
350	201.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2555.37
30	2204.25
35	1960.76
40	1776.14
45	1637.19
50	1538.67
55	1479.38
60	1451
65	1438.7
70	1433.1
75	1429.94
80	1427.69
85	1425.96
90	1424.51
95	1423.34
100	1422.22
105	1421.25
110	1420.6
115	1419.76
120	1418.87

#End of manufacturer data file