#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203426
Mfr serial number	STN11534-03426

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203426

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12978
I_LEAK350V (microA)	0.2018
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.86
20	60.29
30	69.36
40	76.03
50	81.63
60	87.06
70	92.65
80	98.12
90	103.31
100	108.12
110	112.74
120	117.2
130	121.5
140	125.68
150	129.78
160	133.81
170	137.74
180	141.61
190	145.41
200	149.16
210	152.81
220	156.51
230	160.13
240	163.82
250	167.77
260	171.69
270	174.96
280	178.2
290	181.9
300	185.3
310	188.8
320	192
330	195.3
340	198.6
350	201.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2588.77
30	2230.54
35	1981.37
40	1792.71
45	1650.08
50	1545.43
55	1478.98
60	1445.61
65	1431.16
70	1424.95
75	1421.62
80	1419.49
85	1417.83
90	1416.45
95	1415.37
100	1414.38
105	1413.58
110	1412.81
115	1412.16
120	1411.52

#End of manufacturer data file