#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203433
Mfr serial number	STN11534-03433

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203433

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12891
I_LEAK350V (microA)	0.193
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	364																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.42
20	61.72
30	70.92
40	77.72
50	83.21
60	88.48
70	93.79
80	99.04
90	104
100	108.62
110	112.99
120	117.17
130	121.21
140	125.1
150	128.91
160	132.62
170	136.26
180	139.65
190	143.31
200	146.76
210	150.07
220	153.36
230	156.71
240	159.94
250	163.12
260	166.33
270	169.47
280	172.53
290	175.57
300	178.63
310	181.5
320	184.4
330	187.3
340	190.2
350	193
	
#CV	
10	
15	O.L.
20	O.L.
25	2542.25
30	2192.03
35	1948.53
40	1764.58
45	1626.63
50	1529.05
55	1470.62
60	1443.21
65	1431.64
70	1426.47
75	1423.51
80	1421.45
85	1419.9
90	1418.52
95	1417.36
100	1416.43
105	1415.55
110	1414.78
115	1414.03
120	1413.44

#End of manufacturer data file