#General information ITEM section %ITEM SERIAL NUMBER 20220900203435 Mfr serial number STN11534-03435 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 27/06/2001 PROBLEM NO PASSED YES Run number 20220900203435 #Test data Data section %DATA TEMPERATURE (C) 25 I_LEAK150V (microA) 0.16949 I_LEAK350V (microA) 0.2355 Substr Origin 104 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 288 Vdep (V) 60 R Bias Upper (MOhm) 1.45 R Bias Lower (MOhm) 1.27 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 67.02 20 92.12 30 105.5 40 114.8 50 121.45 60 127.3 70 133.13 80 138.64 90 143.73 100 148.48 110 152.99 120 157.32 130 161.5 140 165.54 150 169.49 160 173.35 170 176.96 180 180.6 190 184.2 200 187.7 210 191.2 220 194.6 230 198 240 201.3 250 204.6 260 207.8 270 211 280 214.2 290 217.3 300 220.4 310 223.5 320 226.5 330 229.5 340 232.5 350 235.5 #CV 10 15 O.L. 20 O.L. 25 2528.42 30 2180.47 35 1938.52 40 1755.42 45 1617.9 50 1521.87 55 1466.52 60 1441.02 65 1430.1 70 1425.06 75 1422.21 80 1420.21 85 1418.68 90 1417.38 95 1416.3 100 1415.34 105 1414.41 110 1413.71 115 1412.98 120 1412.43 #End of manufacturer data file