#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203444
Mfr serial number	STN11534-03444

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203444

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12553
I_LEAK350V (microA)	0.1887
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.14
20	58.23
30	66.86
40	73.37
50	78.75
60	84.08
70	89.78
80	95.34
90	100.43
100	105.14
110	109.55
120	113.77
130	117.67
140	121.72
150	125.53
160	129.23
170	132.85
180	136.37
190	139.84
200	143.23
210	146.58
220	149.85
230	153.01
240	156.07
250	159.13
260	162.27
270	165.42
280	168.6
290	171.8
300	174.97
310	177.88
320	180.6
330	183.4
340	186.1
350	188.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2561.85
30	2209.22
35	1964.22
40	1778.14
45	1637.68
50	1536.61
55	1475.16
60	1445.09
65	1432.15
70	1426.47
75	1423.5
80	1421.37
85	1419.75
90	1418.45
95	1417.27
100	1416.27
105	1415.38
110	1414.6
115	1413.88
120	1413.25

#End of manufacturer data file