#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203446
Mfr serial number	STN11534-03446

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203446

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12896
I_LEAK350V (microA)	0.1932
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.36
20	60.35
30	69.36
40	76.15
50	81.74
60	87.17
70	92.76
80	98.24
90	103.35
100	108.1
110	112.61
120	116.92
130	121.06
140	125.06
150	128.96
160	132.6
170	136.49
180	140.16
190	143.73
200	147.1
210	150.56
220	153.86
230	157.19
240	160.48
250	163.72
260	166.86
270	169.97
280	173.05
290	176.07
300	179.06
310	181.8
320	184.7
330	187.7
340	190.4
350	193.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2566.98
30	2213.29
35	1967.61
40	1781.17
45	1639.86
50	1535.22
55	1468.24
60	1434.58
65	1419.94
70	1413.71
75	1410.46
80	1408.29
85	1406.65
90	1405.33
95	1404.24
100	1403.2
105	1402.38
110	1401.64
115	1400.84
120	1400.15

#End of manufacturer data file