#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203449
Mfr serial number	STN11534-03449

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203449

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13461
I_LEAK350V (microA)	0.2013
Substr Origin	104
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.45
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.07
20	62.61
30	72.13
40	79.34
50	85.47
60	91.18
70	96.66
80	102.01
90	107.27
100	112.42
110	117.27
120	121.87
130	126.27
140	130.49
150	134.61
160	138.62
170	142.54
180	146.36
190	150.11
200	153.75
210	157.18
220	160.6
230	164.14
240	167.34
250	170.88
260	174.2
270	177.46
280	180.5
290	183.7
300	186.7
310	189.7
320	192.7
330	195.7
340	198.5
350	201.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2560.7
30	2208.89
35	1964.03
40	1778.7
45	1638.74
50	1536.28
55	1472.1
60	1440.38
65	1426.37
70	1420.16
75	1416.75
80	1414.56
85	1412.93
90	1411.61
95	1410.4
100	1409.39
105	1408.53
110	1407.77
115	1407.04
120	1406.34

#End of manufacturer data file