#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203456
Mfr serial number	STN11535-03456

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203456

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11639
I_LEAK350V (microA)	0.17847
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.13
20	54.98
30	62.35
40	67.68
50	72.57
60	77.36
70	82.71
80	87.74
90	92.42
100	96.85
110	101.02
120	105.05
130	108.97
140	112.78
150	116.39
160	120.14
170	123.63
180	127.14
190	130.54
200	133.89
210	137.2
220	140.41
230	143.56
240	146.72
250	149.54
260	152.79
270	155.74
280	158.68
290	161.59
300	164.41
310	167.33
320	170.23
330	173.14
340	175.95
350	178.47
	
#CV	
10	
15	O.L.
20	2999.77
25	2471.7
30	2135.81
35	1898.58
40	1723.25
45	1589.98
50	1497.37
55	1448.09
60	1428.5
65	1420.82
70	1417.09
75	1414.64
80	1412.88
85	1411.47
90	1410.26
95	1409.21
100	1408.32
105	1407.47
110	1406.83
115	1406.21
120	1405.6

#End of manufacturer data file