#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203462
Mfr serial number	STN11535-03462

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203462

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13301
I_LEAK350V (microA)	0.2058
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.72
20	60.4
30	69.62
40	75.45
50	81.49
60	87.91
70	94.16
80	99.91
90	105.27
100	110.31
110	115.17
120	119.81
130	124.2
140	128.73
150	133.01
160	137.21
170	141.22
180	145.26
190	149.2
200	153.07
210	156.9
220	160.69
230	164.17
240	168.09
250	171.68
260	175.2
270	178.68
280	182.2
290	185.6
300	189.03
310	192.6
320	195.7
330	199
340	202.4
350	205.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2519.23
30	2175.27
35	1931.57
40	1751.51
45	1613.88
50	1514.38
55	1456.4
60	1431.87
65	1422.71
70	1418.46
75	1415.91
80	1414.11
85	1412.67
90	1411.45
95	1410.46
100	1409.58
105	1408.75
110	1408.15
115	1407.53
120	1406.77

#End of manufacturer data file