#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203464
Mfr serial number	STN11535-03464

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203464

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12237
I_LEAK350V (microA)	0.18867
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.72
20	57.81
30	65.64
40	71.4
50	76.7
60	81.85
70	87.24
80	92.39
90	97.23
100	101.8
110	106.19
120	110.38
130	114.46
140	118.45
150	122.37
160	126.18
170	129.87
180	133.37
190	137.14
200	140.76
210	144.25
220	147.72
230	151.1
240	154.42
250	157.7
260	160.92
270	164.07
280	167
290	170.47
300	173.63
310	176.76
320	179.86
330	182.9
340	185.8
350	188.67
	
#CV	
10	
15	O.L.
20	O.L.
25	2503.23
30	2161.85
35	1919.57
40	1742.42
45	1606.91
50	1511.56
55	1458.79
60	1437.15
65	1428.84
70	1424.85
75	1422.39
80	1420.57
85	1419.18
90	1418
95	1417.01
100	1416.11
105	1415.36
110	1414.73
115	1414.08
120	1413.55

#End of manufacturer data file