#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203466
Mfr serial number	STN11535-03466

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203466

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12565
I_LEAK350V (microA)	0.1952
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.9
20	56.99
30	64.66
40	70.55
50	76.44
60	82.76
70	88.57
80	94.05
90	99.14
100	103.99
110	108.59
120	113
130	117.31
140	121.5
150	125.65
160	129.48
170	133.52
180	137.42
190	141.23
200	144.98
210	148.69
220	152.36
230	156.03
240	159.65
250	163.12
260	166.43
270	169.85
280	173.17
290	176.53
300	179.76
310	183.1
320	186.2
330	189.33
340	192.5
350	195.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2503.74
30	2162.21
35	1919.81
40	1741.36
45	1605.31
50	1508.26
55	1453.26
60	1429.92
65	1420.96
70	1416.81
75	1414.25
80	1412.46
85	1411.13
90	1409.94
95	1408.97
100	1408.06
105	1407.31
110	1406.63
115	1406.05
120	1405.42

#End of manufacturer data file