#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203467
Mfr serial number	STN11535-03467

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203467

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14127
I_LEAK350V (microA)	0.2131
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.14
20	58.93
30	69.06
40	78.43
50	86.14
60	93.6
70	100.42
80	106.7
90	112.48
100	117.84
110	122.93
120	127.78
130	132.4
140	136.89
150	141.27
160	145.53
170	149.56
180	153.47
190	157.58
200	161.48
210	165.25
220	169.02
230	172.75
240	176.37
250	179.89
260	183.6
270	187
280	190.2
290	193.5
300	197.01
310	200.3
320	203.2
330	206.8
340	210
350	213.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2515.17
30	2172.74
35	1929.59
40	1750.43
45	1613.68
50	1515.82
55	1459.47
60	1435.29
65	1426.02
70	1421.74
75	1419.19
80	1417.38
85	1415.97
90	1414.8
95	1413.8
100	1412.95
105	1412.18
110	1411.56
115	1410.81
120	1410.33

#End of manufacturer data file