#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203476
Mfr serial number	STN11535-03476

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203476

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.15271
I_LEAK350V (microA)	0.227
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.49
20	78.32
30	88.91
40	96.35
50	102.47
60	108.69
70	114.61
80	120.15
90	125.32
100	130.34
110	134.95
120	139.62
130	144.11
140	148.46
150	152.71
160	156.87
170	160.88
180	164.92
190	168.86
200	172.8
210	176.41
220	180.5
230	184.2
240	187.94
250	191.6
260	195.4
270	199
280	202.7
290	206.4
300	209.8
310	213.5
320	217.2
330	220.6
340	223.7
350	227
	
#CV	
10	
15	O.L.
20	O.L.
25	2488.55
30	2147.32
35	1905.65
40	1728.01
45	1595.31
50	1506.34
55	1458.19
60	1437.59
65	1429.42
70	1425.49
75	1423.14
80	1421.39
85	1419.96
90	1418.9
95	1417.93
100	1417.07
105	1416.28
110	1415.71
115	1415.09
120	1414.55

#End of manufacturer data file