#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203484
Mfr serial number	STN11535-03484

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203484

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.14641
I_LEAK350V (microA)	0.2217
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.74
20	69.28
30	79.3
40	86.51
50	92.9
60	99.6
70	105.97
80	111.93
90	117.52
100	122.78
110	127.82
120	132.7
130	137.37
140	141.95
150	146.41
160	150.78
170	155.03
180	158.98
190	163.31
200	167.37
210	171.39
220	175.32
230	179.2
240	182.9
250	186.7
260	190.3
270	194
280	197.4
290	201.2
300	204.8
310	208.2
320	211.6
330	215.2
340	218.4
350	221.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2495.93
30	2154.32
35	1911.75
40	1734.15
45	1600.16
50	1508.69
55	1458.04
60	1435.77
65	1426.94
70	1422.78
75	1420.3
80	1418.54
85	1417.17
90	1416.05
95	1415.05
100	1414.23
105	1413.44
110	1412.91
115	1412.4
120	1411.64

#End of manufacturer data file