#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203492
Mfr serial number	STN11535-03492

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203492

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1833
I_LEAK350V (microA)	0.2608
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	70.09
20	96.79
30	112.95
40	124.8
50	133.58
60	140.56
70	146.65
80	152.23
90	157.4
100	162.21
110	166.81
120	171.22
130	175.51
140	179.6
150	183.3
160	187.3
170	191.1
180	194.8
190	198.4
200	202
210	205.5
220	209
230	212.5
240	215.9
250	219.3
260	222.6
270	225.8
280	229.1
290	232.3
300	235.6
310	238.8
320	242
330	245
340	248.8
350	260.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2684.92
30	2324.05
35	2065.53
40	1870.75
45	1718.35
50	1598.08
55	1509.68
60	1456.93
65	1431.87
70	1421.47
75	1416.82
80	1414.24
85	1412.52
90	1411.15
95	1410.07
100	1409.11
105	1408.3
110	1407.66
115	1406.97
120	1406.46

#End of manufacturer data file