#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203497
Mfr serial number	STN11536-03497

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	10/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203497

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.16694
I_LEAK350V (microA)	0.2717
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.86
20	67.54
30	78.11
40	86.19
50	94.29
60	103.06
70	111.44
80	119.31
90	126.78
100	133.89
110	140.8
120	147.53
130	154.14
140	160.58
150	166.94
160	173.16
170	179.33
180	185.2
190	191.2
200	197.1
210	203.1
220	208.3
230	214.4
240	220.2
250	226.5
260	232.2
270	236.9
280	241.8
290	246.7
300	251.3
310	255.6
320	259.9
330	264.2
340	268.2
350	271.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2525.02
30	2175.77
35	1932.19
40	1751.11
45	1615.65
50	1521.62
55	1468.19
60	1443.45
65	1432.94
70	1428.05
75	1425.14
80	1423
85	1421.31
90	1419.93
95	1418.69
100	1417.61
105	1416.62
110	1415.79
115	1415.02
120	1414.24

#End of manufacturer data file