#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203498
Mfr serial number	STN11536-03498

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203498

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10882
I_LEAK350V (microA)	0.16248
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.3
20	52.15
30	59.19
40	64.43
50	68.7
60	72.89
70	77.35
80	81.8
90	86.33
100	90.59
110	94.64
120	98.46
130	102.03
140	105.44
150	108.82
160	112.06
170	115.14
180	118.27
190	121.2
200	124.13
210	127.01
220	129.81
230	132.52
240	135.21
250	137.88
260	140.49
270	143.02
280	145.58
290	148.11
300	150.52
310	153.02
320	155.41
330	157.83
340	160.22
350	162.48
	
#CV	
10	
15	O.L.
20	O.L.
25	2517.95
30	2174.96
35	1934.29
40	1755.13
45	1622.39
50	1530.65
55	1478.3
60	1454.44
65	1444.54
70	1439.74
75	1436.97
80	1435
85	1433.29
90	1431.83
95	1430.63
100	1429.56
105	1428.64
110	1427.77
115	1426.98
120	1426.2

#End of manufacturer data file