#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203500
Mfr serial number	STN11536-03500

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	10/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203500

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.15394
I_LEAK350V (microA)	0.2493
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	284
Vdep (V)	60
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.51
20	63.96
30	73.91
40	81.57
50	89.01
60	96.72
70	104.22
80	111.29
90	118.01
100	124.41
110	130.61
120	136.44
130	142.52
140	148.25
150	153.94
160	159.55
170	164.99
180	170.46
190	175.87
200	181.1
210	186.5
220	191.9
230	197.3
240	202.6
250	208
260	213.2
270	218
280	222.5
290	226.8
300	230.9
310	234.9
320	238.3
330	242.2
340	245.7
350	249.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2548.89
30	2196.5
35	1950.44
40	1768.2
45	1631.1
50	1534.19
55	1476.82
60	1449.24
65	1437.31
70	1431.94
75	1428.81
80	1426.64
85	1424.91
90	1423.47
95	1422.27
100	1421.19
105	1420.26
110	1419.52
115	1418.64
120	1417.96

#End of manufacturer data file