#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203507
Mfr serial number	STN11536-03507

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	10/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203507

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14182
I_LEAK350V (microA)	0.2152
Substr Origin	106
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	60
R Bias Upper (MOhm)	1.4
R Bias Lower (MOhm)	1.15

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.37
20	66.79
30	76.27
40	83.41
50	89.29
60	95.43
70	101.7
80	107.69
90	113.26
100	118.52
110	123.35
120	128.24
130	132.91
140	137.4
150	141.82
160	146.1
170	150.23
180	154.39
190	158.46
200	162.43
210	166.11
220	170.16
230	173.94
240	177.6
250	181.4
260	184.9
270	188.4
280	191.8
290	195.3
300	198.7
310	202.1
320	205.4
330	208.6
340	211.9
350	215.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2556.32
30	2203.18
35	1956.82
40	1773.62
45	1635.62
50	1537.04
55	1477.86
60	1449.12
65	1436.68
70	1431.12
75	1427.91
80	1425.73
85	1423.98
90	1422.62
95	1421.35
100	1420.28
105	1419.28
110	1418.57
115	1417.65
120	1417.03

#End of manufacturer data file