#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203539
Mfr serial number	STN11540-03539

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203539

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11424
I_LEAK350V (microA)	0.17647
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.75
20	50.13
30	57.56
40	63.06
50	67.85
60	73.05
70	78.78
80	84.19
90	89.13
100	93.79
110	98.19
120	102.46
130	106.47
140	110.36
150	114.24
160	117.95
170	121.57
180	125.17
190	128.65
200	132.04
210	135.45
220	138.7
230	141.86
240	144.99
250	148.12
260	151.12
270	154.12
280	157.07
290	159.87
300	162.71
310	165.39
320	168.33
330	171.06
340	173.82
350	176.47
	
#CV	
10	
15	O.L.
20	2994.96
25	2466.4
30	2131.13
35	1895.66
40	1721.41
45	1590.33
50	1499.58
55	1449.99
60	1429.56
65	1421.52
70	1417.48
75	1414.94
80	1413.08
85	1411.55
90	1410.25
95	1409.15
100	1408.19
105	1407.28
110	1406.5
115	1405.74
120	1405

#End of manufacturer data file