#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203564
Mfr serial number	STN11540-03564

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203564

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1189
I_LEAK350V (microA)	0.1838
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.72
20	52.16
30	59.9
40	65.83
50	70.91
60	76.17
70	81.77
80	87.19
90	92.57
100	97.44
110	102.11
120	106.58
130	110.78
140	114.87
150	118.9
160	122.82
170	126.55
180	130.34
190	134
200	137.52
210	141.06
220	144.45
230	147.7
240	150.98
250	154.25
260	157.44
270	160.54
280	163.64
290	166.61
300	169.53
310	172.45
320	175.34
330	178.2
340	181
350	183.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2524.37
30	2180.03
35	1938.84
40	1758.99
45	1622.31
50	1522.25
55	1461.66
60	1434.28
65	1423.55
70	1418.66
75	1415.79
80	1413.74
85	1412.15
90	1410.84
95	1409.67
100	1408.64
105	1407.77
110	1406.91
115	1406.22
120	1405.62

#End of manufacturer data file