#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203566
Mfr serial number	STN11540-03566

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203566

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11424
I_LEAK350V (microA)	0.17568
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.19

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	359																																							
Pinhole	476																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	35.78
20	50.06
30	57.41
40	63.06
50	68
60	73.34
70	78.92
80	84.23
90	89.15
100	93.79
110	98.19
120	102.45
130	106.47
140	110.37
150	114.24
160	117.95
170	121.55
180	125.14
190	128.6
200	131.95
210	135.31
220	138.52
230	141.69
240	144.79
250	147.88
260	150.85
270	153.74
280	156.67
290	159.49
300	162.28
310	165.05
320	167.73
330	170.19
340	173.06
350	175.68
	
#CV	
10	
15	O.L.
20	O.L.
25	2513.75
30	2171.97
35	1931.6
40	1752.97
45	1617.48
50	1520.45
55	1463.61
60	1438.5
65	1428.6
70	1424
75	1421.25
80	1419.28
85	1417.68
90	1416.33
95	1415.2
100	1414.15
105	1413.25
110	1412.45
115	1411.73
120	1411.19

#End of manufacturer data file