#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203572
Mfr serial number	STN11541-03572

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203572

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11421
I_LEAK350V (microA)	0.17501
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	55
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	255																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.54
20	51.23
30	58.66
40	64.31
50	69.05
60	73.76
70	78.65
80	83.85
90	88.98
100	93.77
110	98.24
120	102.53
130	106.52
140	110.38
150	114.21
160	117.84
170	121.37
180	124.92
190	128.3
200	131.61
210	134.95
220	138.14
230	141.12
240	144.32
250	147.4
260	150.34
270	153.25
280	156.17
290	158.97
300	161.72
310	164.44
320	167.12
330	169.76
340	172.41
350	175.01
	
#CV	
10	
15	O.L.
20	2935.1
25	2416.99
30	2088.26
35	1858.23
40	1686.98
45	1561.88
50	1483.26
55	1446.11
60	1432.01
65	1426.03
70	1422.55
75	1420.07
80	1418.2
85	1416.63
90	1415.31
95	1414.15
100	1413.08
105	1412.16
110	1411.25
115	1410.57
120	1409.79

#End of manufacturer data file