#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203579
Mfr serial number	STN11541-03579

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203579

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11499
I_LEAK350V (microA)	0.17618
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.59
20	51.67
30	59.13
40	64.76
50	69.55
60	74.4
70	79.63
80	84.89
90	89.84
100	94.49
110	98.92
120	103.17
130	107.19
140	111.1
150	114.99
160	118.68
170	122.17
180	125.77
190	129.08
200	132.35
210	135.72
220	138.89
230	141.82
240	145.1
250	148.21
260	151.18
270	154.11
280	157.03
290	159.88
300	162.68
310	165.46
320	168.18
330	170.85
340	173.56
350	176.18
	
#CV	
10	
15	O.L.
20	2957.29
25	2434.78
30	2103.27
35	1870.41
40	1698.55
45	1571.36
50	1488.48
55	1446.95
60	1430.59
65	1423.81
70	1420.16
75	1417.7
80	1415.76
85	1414.19
90	1412.9
95	1411.76
100	1410.71
105	1409.83
110	1408.98
115	1408.33
120	1407.6

#End of manufacturer data file