#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203587
Mfr serial number	STN11541-03587

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203587

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1125
I_LEAK350V (microA)	0.16997
Substr Origin	105
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.17
20	51.18
30	58.67
40	64.45
50	69.17
60	73.8
70	78.71
80	83.72
90	88.64
100	93.16
110	97.41
120	101.43
130	105.2
140	108.74
150	112.5
160	115.94
170	119.3
180	122.64
190	125.86
200	129
210	132.14
220	135.16
230	138.13
240	141.05
250	143.93
260	146.68
270	149.38
280	152.09
290	154.72
300	157.34
310	159.99
320	162.54
330	165.04
340	167.54
350	169.97
	
#CV	
10	
15	O.L.
20	O.L.
25	2546.57
30	2196.16
35	1951.83
40	1768.56
45	1629.7
50	1528.9
55	1467.49
60	1437.66
65	1424.99
70	1419.28
75	1416.16
80	1413.92
85	1412.26
90	1410.91
95	1409.7
100	1408.59
105	1407.65
110	1406.82
115	1406.06
120	1405.42

#End of manufacturer data file