#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203596
Mfr serial number	STN11541-03596

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	11/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203596

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10474
I_LEAK350V (microA)	0.15778
Substr Origin	105
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	65
R Bias Upper (MOhm)	1.53
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.42
20	49.27
30	56.34
40	61.68
50	66.04
60	70.29
70	74.69
80	79.14
90	83.39
100	87.36
110	91.13
120	94.78
130	98.13
140	101.44
150	104.74
160	107.84
170	110.91
180	113.83
190	116.9
200	119.8
210	122.66
220	125.42
230	128.15
240	130.85
250	133.48
260	136.06
270	138.63
280	141.17
290	143.61
300	146.02
310	148.46
320	150.82
330	153.11
340	155.48
350	157.78
	
#CV	
10	
15	O.L.
20	O.L.
25	2628.82
30	2266.8
35	2014
40	1824.22
45	1678.81
50	1567.71
55	1491.88
60	1450.29
65	1431.12
70	1422.84
75	1418.73
80	1416.27
85	1414.46
90	1413.04
95	1411.83
100	1410.78
105	1409.86
110	1409.1
115	1408.25
120	1407.52

#End of manufacturer data file