#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203604
Mfr serial number	STN11542-03604

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203604

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12259
I_LEAK350V (microA)	0.1854
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.59
20	55.66
30	63.82
40	69.86
50	75.02
60	80.43
70	86.32
80	91.78
90	96.87
100	101.56
110	106.13
120	110.44
130	114.6
140	118.6
150	122.59
160	126.41
170	130.05
180	133.46
190	137.16
200	140.6
210	143.99
220	147.35
230	150.6
240	153.74
250	156.93
260	159.92
270	162.92
280	165.92
290	168.79
300	171.64
310	174.52
320	177.29
330	180.05
340	182.8
350	185.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2540.55
30	2191.74
35	1946.06
40	1764.45
45	1624.34
50	1520.39
55	1457
60	1428.33
65	1417.34
70	1412.47
75	1409.76
80	1407.82
85	1406.28
90	1405.03
95	1403.91
100	1402.96
105	1402.12
110	1401.46
115	1400.77
120	1400.32

#End of manufacturer data file