#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203605
Mfr serial number	STN11542-03605

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203605

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12471
I_LEAK350V (microA)	0.1886
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.48
20	57.03
30	65.13
40	71.29
50	76.44
60	81.86
70	87.9
80	93.52
90	98.64
100	103.46
110	108.06
120	112.47
130	116.64
140	120.68
150	124.71
160	128.55
170	132.28
180	136
190	139.49
200	142.64
210	146.4
220	149.75
230	153.06
240	156.33
250	159.55
260	162.66
270	165.74
280	168.79
290	171.76
300	174.66
310	177.6
320	180.44
330	183.1
340	185.9
350	188.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2552.36
30	2202.1
35	1956.15
40	1773.18
45	1632.08
50	1525.94
55	1458.45
60	1426.75
65	1414.35
70	1409.03
75	1406.06
80	1404.02
85	1402.44
90	1401.19
95	1400.07
100	1399.05
105	1398.22
110	1397.56
115	1396.85
120	1396.31

#End of manufacturer data file