#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203606
Mfr serial number	STN11542-03606

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203606

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13149
I_LEAK350V (microA)	0.1955
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.11
20	62.43
30	71.41
40	78.14
50	83.63
60	89.12
70	94.76
80	100.33
90	105.44
100	110.22
110	114.77
120	119.2
130	123.4
140	127.44
150	131.49
160	135.32
170	138.98
180	142.49
190	146.26
200	149.75
210	153.22
220	156.61
230	159.94
240	163.2
250	166.41
260	169.55
270	172.62
280	175.67
290	178.63
300	181.5
310	184.4
320	187.2
330	190
340	192.8
350	195.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2556.81
30	2205.96
35	1959.29
40	1776.06
45	1634.86
50	1528.25
55	1459.22
60	1425.65
65	1412.34
70	1406.78
75	1403.8
80	1401.75
85	1400.14
90	1398.91
95	1397.77
100	1396.81
105	1395.96
110	1395.28
115	1394.56
120	1393.98

#End of manufacturer data file