#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203607
Mfr serial number	STN11542-03607

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203607

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13407
I_LEAK350V (microA)	0.1986
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	47.18
20	64.7
30	73.84
40	80.58
50	86.12
60	91.74
70	97.55
80	102.96
90	108.03
100	112.67
110	117.32
120	121.71
130	125.92
140	130.01
150	134.07
160	137.97
170	141.71
180	145.42
190	148.95
200	152.46
210	155.97
220	159.39
230	162.72
240	166
250	169.3
260	172.45
270	175.56
280	178.68
290	181.6
300	184.6
310	187.5
320	190.3
330	193.1
340	195.9
350	198.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2550.67
30	2201.11
35	1955.26
40	1772.98
45	1632.52
50	1527.3
55	1460.73
60	1429.02
65	1416.57
70	1411.3
75	1408.41
80	1406.44
85	1404.87
90	1403.59
95	1402.48
100	1401.5
105	1400.67
110	1399.92
115	1399.33
120	1398.83

#End of manufacturer data file