#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203609
Mfr serial number	STN11542-03609

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203609

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13624
I_LEAK350V (microA)	0.2044
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.75
20	64.56
30	73.75
40	80.55
50	86.21
60	91.99
70	97.94
80	103.71
90	109.03
100	114.04
110	118.71
120	123.33
130	127.75
140	132.01
150	136.24
160	140.27
170	144.3
180	148.29
190	152.15
200	155.91
210	159.66
220	163.28
230	166.82
240	170.3
250	173.75
260	177.08
270	180.35
280	183.6
290	186.7
300	189.7
310	192.8
320	195.7
330	198.6
340	201.5
350	204.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2545.71
30	2197.34
35	1952.31
40	1770.52
45	1630.71
50	1526.34
55	1460.97
60	1430.6
65	1418.93
70	1413.87
75	1411.06
80	1409.06
85	1407.43
90	1406.18
95	1405.06
100	1404.17
105	1403.36
110	1402.72
115	1402.01
120	1401.51

#End of manufacturer data file