#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203622
Mfr serial number	STN11542-03622

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203622

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.15884
I_LEAK350V (microA)	0.2663
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	48.16
20	68.34
30	78.53
40	86.36
50	92.95
60	101.56
70	109.44
80	116.48
90	123
100	129.51
110	135.62
120	141.63
130	147.51
140	153.18
150	158.84
160	164.31
170	169.64
180	174.97
190	180.16
200	185.2
210	190.3
220	194.8
230	200.1
240	205
250	209.9
260	214.5
270	219.2
280	223.9
290	228.3
300	233.1
310	238.2
320	242.8
330	247.8
340	254.8
350	266.3
	
#CV	
10	
15	O.L.
20	2981.28
25	2456.14
30	2121.69
35	1885.39
40	1709.82
45	1576.3
50	1485.13
55	1436.85
60	1417.2
65	1409.27
70	1405.76
75	1403.79
80	1401.93
85	1400.54
90	1399.43
95	1398.49
100	1398.58
105	1397.15
110	1396.57
115	1396.08
120	1395.58

#End of manufacturer data file