#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203632
Mfr serial number	STN11542-03632

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203632

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09353
I_LEAK350V (microA)	0.13971
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.73
20	44.88
30	50.71
40	55.1
50	58.8
60	62.56
70	66.41
80	70.18
90	73.87
100	77.46
110	80.99
120	84.43
130	87.55
140	90.55
150	93.53
160	96.3
170	99.03
180	101.73
190	104.31
200	106.83
210	109.35
220	111.73
230	114.09
240	116.41
250	118.74
260	120.96
270	123.15
280	125.37
290	127.52
300	129.65
310	131.78
320	133.8
330	135.82
340	137.83
350	139.71
	
#CV	
10	
15	O.L.
20	2988.99
25	2463.15
30	2130.57
35	1894.76
40	1721.9
45	1592.42
50	1504.05
55	1456.58
60	1436.91
65	1429.2
70	1425.38
75	1422.86
80	1421.03
85	1419.43
90	1418.1
95	1416.86
100	1415.76
105	1414.83
110	1413.97
115	1413.15
120	1412.48

#End of manufacturer data file