#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203636
Mfr serial number	STN11542-03636

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203636

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.16462
I_LEAK350V (microA)	0.2622
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.49
R Bias Lower (MOhm)	1.25

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	49.3
20	69.65
30	80.12
40	87.87
50	94.95
60	103.91
70	112.28
80	119.85
90	126.96
100	133.76
110	140.09
120	146.7
130	152.77
140	158.71
150	164.62
160	170.34
170	175.96
180	181.5
190	186.9
200	192.2
210	197.8
220	203
230	208.1
240	213.2
250	218.4
260	223.5
270	228.5
280	233.8
290	238.8
300	243.3
310	247.3
320	251.4
330	255.3
340	258.7
350	262.2
	
#CV	
10	
15	O.L.
20	2996.33
25	2466.12
30	2128.66
35	1889.87
40	1713.29
45	1579.48
50	1488.4
55	1441.32
60	1423.13
65	1416.03
70	1412.43
75	1410.2
80	1408.47
85	1407.17
90	1406.07
95	1405.21
100	1404.48
105	1403.81
110	1403.36
115	1402.88
120	1402.36

#End of manufacturer data file