#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203647
Mfr serial number	STN11543-03647

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203647

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10372
I_LEAK350V (microA)	0.15212
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.67
20	51.79
30	58.14
40	62.84
50	66.79
60	71.09
70	75.67
80	79.96
90	83.91
100	87.62
110	91.12
120	94.51
130	97.69
140	100.75
150	103.72
160	106.74
170	109.59
180	112.43
190	115.15
200	117.82
210	120.48
220	123.04
230	125.54
240	127.97
250	130.39
260	132.69
270	134.93
280	137.17
290	139.34
300	141.52
310	143.7
320	145.82
330	147.94
340	150.07
350	152.12
	
#CV	
10	
15	O.L.
20	O.L.
25	2492.69
30	2153.33
35	1914.22
40	1738.9
45	1605.91
50	1512.67
55	1460
60	1437.31
65	1428.48
70	1424.31
75	1421.74
80	1419.88
85	1418.36
90	1417.13
95	1416.08
100	1415.09
105	1414.21
110	1413.44
115	1412.58
120	1411.92

#End of manufacturer data file