#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203650
Mfr serial number	STN11543-03650

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203650

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.0986
I_LEAK350V (microA)	0.14489
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.53
20	48.31
30	54.35
40	58.91
50	62.84
60	66.95
70	71.21
80	75.39
90	79.24
100	82.84
110	86.25
120	89.55
130	92.65
140	95.63
150	98.6
160	101.43
170	104.16
180	106.93
190	109.55
200	112.13
210	114.72
220	117.11
230	119.61
240	121.94
250	124.2
260	126.3
270	128.44
280	130.63
290	132.76
300	134.87
310	136.94
320	138.98
330	141
340	142.97
350	144.89
	
#CV	
10	
15	O.L.
20	O.L.
25	2501.74
30	2160.66
35	1919.85
40	1743.57
45	1609.34
50	1514.11
55	1458.7
60	1433.82
65	1423.9
70	1419.29
75	1416.57
80	1414.64
85	1413.11
90	1411.83
95	1410.77
100	1409.83
105	1408.92
110	1408.27
115	1407.52
120	1406.81

#End of manufacturer data file