#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203666
Mfr serial number	STN11543-03666

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203666

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10785
I_LEAK350V (microA)	0.15662
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.39
20	52.71
30	59.74
40	65.07
50	69.43
60	73.79
70	78.48
80	83.08
90	87.22
100	91.06
110	94.76
120	98.25
130	101.49
140	104.69
150	107.85
160	110.85
170	113.74
180	116.65
190	119.45
200	122.14
210	124.83
220	127.46
230	129.86
240	132.28
250	134.65
260	137.06
270	139.37
280	141.74
290	143.97
300	146.14
310	148.3
320	150.44
330	152.54
340	154.63
350	156.62
	
#CV	
10	
15	O.L.
20	O.L.
25	2575.99
30	2223.46
35	1975.76
40	1792.18
45	1651.08
50	1544.31
55	1474.52
60	1440.12
65	1426.11
70	1420.14
75	1417.02
80	1414.92
85	1413.32
90	1411.97
95	1410.86
100	1409.86
105	1409.01
110	1408.15
115	1407.37
120	1406.75

#End of manufacturer data file