#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203667
Mfr serial number	STN11543-03667

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203667

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10191
I_LEAK350V (microA)	0.15103
Substr Origin	107
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.72
20	48.11
30	54.48
40	59.33
50	63.44
60	67.71
70	72.26
80	76.78
90	81.01
100	84.93
110	88.63
120	92.18
130	95.49
140	98.71
150	101.91
160	104.86
170	107.89
180	110.84
190	113.66
200	116.42
210	119.17
220	121.78
230	124.33
240	126.81
250	129.22
260	131.52
270	133.79
280	136.11
290	138.36
300	140.56
310	142.75
320	144.87
330	146.94
340	149.02
350	151.03
	
#CV	
10	
15	O.L.
20	O.L.
25	2572.71
30	2220.82
35	1974.05
40	1790.58
45	1650.13
50	1544.72
55	1476.8
60	1443.61
65	1430.25
70	1424.73
75	1421.62
80	1419.51
85	1417.81
90	1416.45
95	1415.32
100	1414.3
105	1413.4
110	1412.62
115	1411.89
120	1411.24

#End of manufacturer data file