#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203670
Mfr serial number	STN11543-03670

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	12/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203670

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10298
I_LEAK350V (microA)	0.1523
Substr Origin	109
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	55
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.27

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.48
20	49.13
30	55.74
40	60.45
50	64.5
60	68.78
70	73.46
80	78.09
90	82.29
100	86.19
110	89.84
120	93.36
130	96.66
140	99.83
150	102.98
160	105.97
170	108.89
180	111.8
190	114.61
200	117.34
210	120.08
220	122.67
230	125.2
240	127.64
250	130.07
260	132.42
270	134.81
280	137.16
290	139.39
300	141.64
310	143.77
320	146.01
330	148.14
340	150.25
350	152.3
	
#CV	
10	
15	O.L.
20	2910.08
25	2395.61
30	2069.39
35	1839.19
40	1672.17
45	1550.57
50	1475.86
55	1441.12
60	1428.01
65	1422.36
70	1419.19
75	1416.93
80	1415.23
85	1413.82
90	1412.6
95	1411.51
100	1410.54
105	1409.7
110	1409.03
115	1408.28
120	1407.59

#End of manufacturer data file