#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203722
Mfr serial number	STN11547-03722

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	16/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203722

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14379
I_LEAK350V (microA)	0.2269
Substr Origin	111
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.7
20	61.75
30	71.26
40	78.57
50	84.7
60	90.89
70	97.88
80	104.79
90	111.22
100	117.24
110	122.95
120	128.18
130	133.65
140	138.76
150	143.79
160	148.66
170	153.25
180	157.92
190	162.48
200	166.95
210	171.33
220	175.41
230	179.93
240	184.1
250	188.2
260	192.28
270	196.3
280	200.1
290	204.1
300	207.9
310	211.8
320	215.7
330	219.4
340	223.1
350	226.9
	
#CV	
10	
15	O.L.
20	O.L.
25	2759.26
30	2375.39
35	2109
40	1910.09
45	1755.63
50	1634.49
55	1540.8
60	1479.64
65	1448.17
70	1434.86
75	1429.05
80	1425.8
85	1423.6
90	1421.89
95	1420.47
100	1419.28
105	1418.21
110	1417.32
115	1416.32
120	1415.72

#End of manufacturer data file