#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203740
Mfr serial number	STN11548-03740

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203740

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13966
I_LEAK350V (microA)	0.2208
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	156																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.53
20	59.13
30	68.25
40	75.28
50	81.73
60	88.44
70	95.34
80	101.83
90	107.92
100	113.68
110	119.19
120	124.52
130	129.46
140	134.73
150	139.66
160	144.48
170	149.21
180	153.84
190	158.35
200	162.76
210	167.02
220	171.26
230	175.47
240	179.59
250	183.5
260	187.4
270	191.3
280	195.1
290	198.9
300	202.6
310	206.3
320	210
330	213.7
340	217.2
350	220.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2515.81
30	2170.05
35	1926.71
40	1748.64
45	1612.67
50	1515.5
55	1459.65
60	1435.57
65	1426.21
70	1421.77
75	1419.05
80	1417.03
85	1415.4
90	1414.01
95	1412.8
100	1411.73
105	1410.76
110	1409.89
115	1409.03
120	1408.48

#End of manufacturer data file