#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203742
Mfr serial number	STN11548-03742

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203742

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13241
I_LEAK350V (microA)	0.207
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.77
20	56.83
30	65.79
40	72.13
50	77.97
60	84.31
70	90.89
80	97.03
90	102.76
100	108.18
110	113.37
120	118.35
130	123.16
140	127.83
150	132.41
160	136.88
170	141.26
180	145.47
190	149.64
200	153.67
210	157.66
220	161.62
230	165.49
240	169.28
250	173.01
260	176.67
270	180.3
280	183.7
290	187.1
300	190.5
310	193.6
320	197.2
330	200.6
340	203.8
350	207
	
#CV	
10	
15	O.L.
20	O.L.
25	2515.54
30	2170.4
35	1928.08
40	1750.13
45	1614.65
50	1517.99
55	1462.68
60	1438.85
65	1429.47
70	1424.92
75	1422.14
80	1420.08
85	1418.41
90	1416.99
95	1415.76
100	1414.66
105	1413.67
110	1412.84
115	1412.11
120	1411.49

#End of manufacturer data file