#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203744
Mfr serial number	STN11548-03744

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203744

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13412
I_LEAK350V (microA)	0.2097
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.45
20	57.85
30	66.47
40	73.09
50	79.03
60	85.62
70	92.25
80	98.43
90	104.21
100	109.67
110	114.88
120	119.92
130	124.78
140	129.51
150	134.12
160	138.65
170	143.07
180	147.36
190	151.5
200	155.36
210	159.63
220	163.62
230	167.56
240	171.43
250	175.21
260	178.91
270	182.4
280	186
290	189.5
300	193
310	196.4
320	199.8
330	203.2
340	206.5
350	209.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2527.72
30	2180.55
35	1936.88
40	1757.25
45	1620.53
50	1521.99
55	1464.21
60	1438.71
65	1428.74
70	1424.07
75	1421.21
80	1419.11
85	1417.43
90	1416.03
95	1414.81
100	1413.76
105	1412.87
110	1412.04
115	1411.17
120	1410.61

#End of manufacturer data file