#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203747
Mfr serial number	STN11548-03747

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203747

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13282
I_LEAK350V (microA)	0.2078
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	66																																							
Pinhole	77																																							
Pinhole	398																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	40.65
20	58.04
30	66.86
40	73.57
50	79.43
60	85.49
70	91.78
80	97.9
90	103.57
100	108.95
110	114.02
120	118.95
130	123.7
140	128.3
150	132.82
160	137.26
170	141.33
180	145.82
190	149.95
200	153.92
210	157.87
220	161.78
230	165.6
240	169.42
250	173.19
260	176.88
270	180.5
280	183.9
290	187.4
300	190.9
310	194.3
320	197.7
330	201
340	204.4
350	207.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2485.51
30	2144.73
35	1905.39
40	1729.68
45	1597.53
50	1507.98
55	1460.96
60	1442.04
65	1434.31
70	1430.26
75	1427.64
80	1425.64
85	1424
90	1422.6
95	1421.36
100	1420.27
105	1419.25
110	1418.38
115	1417.52
120	1416.93

#End of manufacturer data file