#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203749
Mfr serial number	STN11548-03749

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203749

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13453
I_LEAK350V (microA)	0.2007
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	123																																							
Pinhole	362																																							
Pinhole	384																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	45.23
20	64.6
30	74.08
40	80.94
50	86.48
60	91.97
70	97.67
80	103.15
90	108.31
100	112.98
110	117.71
120	122.12
130	126.39
140	130.51
150	134.53
160	138.48
170	142.33
180	146.12
190	149.82
200	153.36
210	156.86
220	160.29
230	163.7
240	167.07
250	170.36
260	173.65
270	176.87
280	180.01
290	183
300	186
310	189
320	192
330	194.9
340	197.8
350	200.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2486.56
30	2145.86
35	1906.39
40	1730.96
45	1598.89
50	1508.71
55	1460.36
60	1440.47
65	1432.43
70	1428.34
75	1425.69
80	1423.72
85	1422.13
90	1420.74
95	1419.55
100	1418.44
105	1417.45
110	1416.58
115	1415.73
120	1415.04

#End of manufacturer data file