#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203750
Mfr serial number	STN11548-03750

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/07/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203750

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13519
I_LEAK350V (microA)	0.2028
Substr Origin	108
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.56
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.04
20	63.81
30	73.22
40	80.11
50	85.93
60	91.5
70	97.18
80	102.86
90	108.2
100	113.18
110	117.94
120	122.46
130	126.83
140	131.07
150	135.19
160	139.23
170	142.96
180	147.04
190	150.82
200	154.48
210	157.99
220	161.52
230	164.99
240	168.48
250	171.88
260	175.21
270	178.49
280	181.5
290	184.7
300	187.8
310	190.8
320	193.8
330	196.9
340	199.9
350	202.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2479.66
30	2139.67
35	1900.57
40	1725.62
45	1594.59
50	1506.56
55	1460.9
60	1442.38
65	1434.92
70	1430.91
75	1428.31
80	1426.34
85	1424.67
90	1423.3
95	1422.12
100	1421.06
105	1420.18
110	1419.27
115	1418.56
120	1417.82

#End of manufacturer data file